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Threshold model
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111	THRESHOLD TM Volume 31, No.2 March/April 2015 Add to Reading List Source URL: www.esda.org Language: English - Date: 2015-03-03 13:44:28 Electrical safety Electrical breakdown Plasma physics Electrostatic discharge Ted Dangelmayer Human-body model Charged-device model JEDEC Electrostatic-sensitive device Electromagnetism Physics Electrostatics
112	Project Subjects Elucidation of the Mechanisms of Low Dose Radiation Effects Background and Objective The linear non-threshold (LNT) model, which is the basis of current system for radiological protection, uses linear ex Add to Reading List Source URL: criepi.denken.or.jp Language: English - Date: 2011-11-04 00:31:38 Microbeam Ionizing radiation Radiation therapy DNA repair Linear no-threshold model Mutation Background radiation Radiation Gray Medicine Radiobiology Radioactivity
113	A Model for Timing Errors in Processors with Parameter Variation ∗ Smruti R. Sarangi, Brian Greskamp, and Josep Torrellas University of Illinois at Urbana-Champaign {sarangi,greskamp,torrellas}@cs.uiuc.edu http://iacom Add to Reading List Source URL: iacoma.cs.uiuc.edu Language: English - Date: 2007-01-31 13:57:57 Measurement Threshold voltage MOSFET Accuracy and precision Process variation Very-large-scale integration Statistics Electrical engineering Thought
114	DOC Document Add to Reading List Source URL: hpschapters.org Language: English - Date: 2014-10-24 04:11:36 Medical physics Radiation oncology Nuclear physics Ionizing radiation Linear no-threshold model Background radiation Radiation therapy Radiation protection Multnomah County Poor Farm Medicine Radiobiology Radioactivity
115	VARIUS: A Model of Parameter Variation and Resulting Timing Errors for Microarchitects ∗ Radu Teodorescu, Brian Greskamp, Jun Nakano, Smruti R. Sarangi, Abhishek Tiwari and Josep Torrellas University of Illinois at Urb Add to Reading List Source URL: iacoma.cs.uiuc.edu Language: English - Date: 2008-08-29 19:33:45 Regression analysis Computer memory MOSFET Normal distribution Dynamic random-access memory Standard deviation Threshold voltage Systematic error Errors and residuals in statistics Statistics Data analysis Measurement
116	VARIUS-NTV: A Microarchitectural Model to Capture the Increased Sensitivity of Manycores to Process Variations at Near-Threshold Voltages ‡ Ulya R. Karpuzcu∗ , Krishna B. Kolluru† , Nam Sung Kim† , and Josep Torr Add to Reading List Source URL: iacoma.cs.uiuc.edu Language: English - Date: 2012-04-21 17:10:28 Computing Computer memory Computer architecture Microprocessors Multi-core processor Parallel computing IC power supply pin MOSFET Random-access memory Integrated circuits Electronic engineering Electronics
117	November 2005/January[removed]NCCHPS Mark Your Calendars! Add to Reading List Source URL: hpschapters.org Language: English - Date: 2008-11-13 12:54:24 Medical physics Radioactivity Linear no-threshold model Ionizing radiation Health physics Radiation protection Radiation Non-ionizing radiation Medicine Health Radiobiology
118	THRESHOLD TM Volume 31, No.2 March/April 2015 Add to Reading List Source URL: esda.org Language: English - Date: 2015-03-03 13:44:28 Electrical safety Electrical breakdown Plasma physics Electrostatic discharge Ted Dangelmayer Human-body model Charged-device model JEDEC Electrostatic-sensitive device Electromagnetism Physics Electrostatics
119	Microsoft PowerPoint - Low dose physics presentation[removed]ppt Add to Reading List Source URL: hpschapters.org Language: English - Date: 2008-11-13 12:54:23 Radiation oncology Radioactivity Nuclear physics Radiation therapy Ionizing radiation Dosimetry Linear no-threshold model Absorbed dose Radiation Medicine Radiobiology Medical physics

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